Assessments Logistic Approximations of Marginal Trace Lines to Develop Short Assessments
Brian D. Stucky, David M. Thissen and Maria Orlando Edelen
The article proposes to use the marginal trace lines as a method for capturing the relationship between the general dimension and the item response meanwhile to account for the nuisance association with the secondary dimension for graded response items. The marginal trace line is obtained by weighting the trace surface by the normal distribution and integrating out the nuisance dimension using quadrature.
The properties of marginal trace lines were evaluated.
They can be effective in developing diverse, unidimensional short forms measuring primary dimensions of bifactor IRT models.
1 Some simulation study should be used for demonstrate the performance of the method
2 what is the performance of the Short Assessments created by the method, will they really represent the whole test, will they have the same precision and accuracy parameter as the whole test?